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Hall Cell Technology: Using the Plot of Cell Voltage as a Function of Current to Determine the Current Efficiency Lost by Leakage Current

Hall Cell Technology: Using the Plot of Cell Voltage as a Function of Current to Determine the Current Efficiency Lost by Leakage Current    cover image
Hall Cell Technology: Using the Plot of Cell Voltage as a Function of Current to Determine the Current Efficiency Lost by Leakage Current    cover image Hall Cell Technology: Using the Plot of Cell Voltage as a Function of Current to Determine the Current Efficiency Lost by Leakage Current    cover image Hall Cell Technology: Using the Plot of Cell Voltage as a Function of Current to Determine the Current Efficiency Lost by Leakage Current    cover image
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by: Wayne Cotten
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Publication Date: June 24, 2016
Book Size: 6" x 9"
Pages: 25
Binding: Perfect Bound
Color: Black and White

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$9.95
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Book Synopsis
In slightly more than 100 years, the electrochemical production of aluminum from aluminum oxide has grown from invention to the technology of today.
The single most important change related to efficiency improvement was the application of computer control. Within computer control, the two most important programs are resistance control and alumina feed control.
Within the resistance control program, the formula used to calculate a cell’s resistance utilizes a constant that is assumed to be the intercept of the resistance line at zero current. In reality, the intercept is lowered by leakage current and therefore reflects current efficiency loss due to the leakage current.
The purpose of this paper is to develop the mathematical relationship between the intercept voltage and current efficiency loss due leakage current.
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